Field-effect transistors of high-mobility few-layer SnSe2

Few-layer SnSe2 transistors with high on/off ratios

Improved carrier mobility in few-layer MoS2 field-effect transistors with ionic-liquid gating.

We report the fabrication of ionic liquid (IL)-gated field-effect transistors (FETs) consisting of bilayer and few-layer MoS2. Our transport measurements indicate that the electron mobility μ ≈ 60 cm(2) V(-1) s(-1) at 250 K in IL-gated devices exceeds significantly that of comparable back-gated devices. IL-FETs display a mobility increase from ≈ 100 cm(2) V(-1) s(-1) at 180 K to ≈ 220 cm(2) V(-...

Few-layer HfS2 transistors

HfS2 is the novel transition metal dichalcogenide, which has not been experimentally investigated as the material for electron devices. As per the theoretical calculations, HfS2 has the potential for well-balanced mobility (1,800 cm(2)/V·s) and bandgap (1.2 eV) and hence it can be a good candidate for realizing low-power devices. In this paper, the fundamental properties of few-layer HfS2 flake...

Simulation study of the electron mobility in few-layer MoS2 metal¬タモinsulator-semiconductor field-effect transistors

This work analyzes the electron mobility in few-layer MoS2-based metal–insulator-semiconductor field-effect transistors. To do it, the Poisson and Schrödinger equations are self consistently solved using the effective mass approximation to model the six equivalent K valleys characteristic of multilayer MoS2. The mobility is calculated using the Kubo-Greenwood approach under the momentum relaxat...

High electron mobility InAs nanowire field-effect transistors.

Single-crystal InAs nanowires (NWs) are synthesized using metal-organic chemical vapor deposition (MOCVD) and fabricated into NW field-effect transistors (NWFETs) on a SiO(2)/n(+)-Si substrate with a global n(+)-Si back-gate and sputtered SiO(x)/Au underlap top-gate. For top-gate NWFETs, we have developed a model that allows accurate estimation of characteristic NW parameters, including carrier...